Marc De Graef

Marc De Graef. “Recent Progress in Lorentz Transmission Electron Microscopy”. (2009)

N de Jonge, MJ Dukes, GJ Kremers, BM Northan, DB Peckys, EA Ring, DW Piston, R Sougrat

N de Jonge, MJ Dukes, GJ Kremers, BM Northan, DB Peckys, EA Ring, DW Piston, R Sougrat. “Liquid and Three-Dimensional Scanning Transmission Electron Microscopy for Biological Specimen”. Microscopy and Microanalysis (2009)

N. de Jonge, D. B. Peckys, G. J. Kremers, D. W. Piston

N. de Jonge, D. B. Peckys, G. J. Kremers, D. W. Piston. “Electron microscopy of whole cells in liquid with nanometer resolution”. Proceedings of the National Academy of Sciences (2009)

D Diercks, BP Gorman, CL Cheung, G Wang

D Diercks, BP Gorman, CL Cheung, G Wang. “Techniques for Consecutive TEM and Atom Probe Tomography Analysis of Nanowires”. Microscopy and Microanalysis (2009)

X Zhong, B Kabius, D Schreiber, J Eastman, D Fong, A Petford-Long

X Zhong, B Kabius, D Schreiber, J Eastman, D Fong, A Petford-Long. “Quantification of Interfacial Roughness of In2O3/ZrO2 Superlattice Films in 3D”. Microscopy and Microanalysis (2009)

Avetik R. Harutyunyan, Gugang Chen, Tereza M. Paronyan, Elena M. Pigos, Oleg A. Kuznetsov, Kapila Hewaparakrama, Seung Min Kim, Dmitri Zakharov, Eric A. Stach, Gamini U. Sumanasekera

Avetik R. Harutyunyan, Gugang Chen, Tereza M. Paronyan, Elena M. Pigos, Oleg A. Kuznetsov, Kapila Hewaparakrama, Seung Min Kim, Dmitri Zakharov, Eric A. Stach, Gamini U. Sumanasekera. “Preferential Growth of Single-Walled Carbon Nanotubes with Metallic Conductivity”. Science (2009)

S. Kumar, M. A. Haque, H. Gao

S. Kumar, M. A. Haque, H. Gao. “Notch insensitive fracture in nanoscale thin films”. Applied Physics Letters (2009)

C Winkler, L Martin, C Johnson, M Taheri

C Winkler, L Martin, C Johnson, M Taheri. “In-Situ TEM Observation of Domain Behavior in Multiferroic Structures Under Applied DC Bias”. Microscopy and Microanalysis (2009)

Brian P Gorman, David Diercks, Norman Salmon, Eric Stach, Gonzalo Amador, Cheryl Hartfield

Brian P Gorman, David Diercks, Norman Salmon, Eric Stach, Gonzalo Amador, Cheryl Hartfield. “Hardware and Techniques for Cross- Correlative TEM and Atom Probe Analysis”. Microscopy Today (2008)

N Salmon, D Vetter, EA Stach

N Salmon, D Vetter, EA Stach. “Development of a high accuracy, large range and backlash free single-tilt/rotation (alpha-gamma) holder for precise alignment of TEM samples”. Microscopy and Microanalysis (2008)

M Marko, C Hsieh, N Salmon, M Rodriguez, J Frank, C Mannella

M Marko, C Hsieh, N Salmon, M Rodriguez, J Frank, C Mannella. “FIB Milling of Frozen-hydrated Cells and Tissue for TEM Cryo-Tomography”. Microscopy and Microanalysis (2008)

Stefan Meister, David T. Schoen, Mark A. Topinka, Andrew M. Minor, Yi Cui

Stefan Meister, David T. Schoen, Mark A. Topinka, Andrew M. Minor, Yi Cui. “Void Formation Induced Electrical Switching in Phase-Change Nanowires”.  Nano Letters (2008)

Hailin Peng, Chong Xie, David T. Schoen, Yi Cui

Hailin Peng, Chong Xie, David T. Schoen, Yi Cui. “Large Anisotropy of Electrical Properties in Layer-Structured In2Se3 Nanowires”. Nano Letters (2008)

A.N.Chiaramonti, L.J.Thompson, W.F. Egelhoff, B.C. Kabius, A.K.Petford-Long

A.N. Chiaramonti, L.J. Thompson, W.F. Egelhoff, B.C. Kabius, A.K. Petford-Long. “In situ TEM studies of local transport and structure in nanoscale multilayer films”. Ultramicroscopy (2008)

Thomas F. Kelly, David J. Larson, Keith Thompson, Roger L. Alvis, Joseph H. Bunton, Jesse D. Olson, Brian P. Gorman

Thomas F. Kelly, David J. Larson, Keith Thompson, Roger L. Alvis, Joseph H. Bunton, Jesse D. Olson, Brian P. Gorman. “Atom Probe Tomography of Electronic Materials”. Annual Review of Materials Research (2007)

M Marko, M Scheeff, N Salmon, C Hsieh, M Rodriguez, J Frank, C Mannella

M Marko, M Scheeff, N Salmon, C Hsieh, M Rodriguez, J Frank, C Mannella. “Use of Focused Ion Beam Milling for Preparation of Frozen-Hydrated Specimens for TEM Tomography”. Microscopy and Microanalysis (2007)