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Technical Specs
Instrument Type
TEM

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Built on Engineering Excellence

High Impact Publications

Matthew Mecklenburg, William A. Hubbard, Jared J. Lodico, B.C. Regan. “Electron beam-induced current imaging with two-angstrom resolution”. Ultramicroscopy (2019)

William A. Hubbard, Matthew Mecklenburg, Ho Leung Chan, B. C. Regan. “STEM Imaging with Beam-Induced Hole and Secondary Electron Currents”. Physical Review Applied (2018)

Jared J Lodico, William A Hubbard, B C Regan. “Scanning TEM Electron Beam Induced Current Imaging in Water”. Microscopy and Microanalysis (2018)

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