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Hummingbird Scientific’s Nano-Manipulator provides precise, reliable in-situ TEM biasing and manipulation without compromising imaging quality.

Hummingbird Scientific’s in-situ Biasing Manipulator is a proven TEM holder that enables precise in-situ sample manipulation and site-specific electrical biasing. It provides accurate, uncoupled X, Y, and Z motion for easy point-contact formation while preserving high-resolution imaging. The holder is easy to use, low maintenance, and compatible with JEOL, Thermo Fisher Scientific, and Hitachi TEMs, supporting applications such as batteries, nano-electronics, solar cells, and semiconductors.

Technical Specs
1800 Series
Coarse Movement Range:
X axis
> 1000 µm
Y and Z axes
500 – 1000 µm
Fine Movement Range:
X axis
2 – 3 µm
Y and Z axes
~ 40 µm
Electrical Contacts
2 standard (3 – 7)*
Current Resolution
100 pA standard (< 10 pA)*
Sample Compatibility
3 mm half grids, FIB lift-out grids, or custom*
Instrument Type
TEM

Available For:

Built on Engineering Excellence

High Impact Publications

Nikhilendra Singh, James P Horwath, Patrick Bonnick, Koji Suto, Eric A Stach, Tomoya Matsunaga, John Muldoon, Timothy S Arthur. “Role of Lithium Iodide Addition to Lithium Thiophosphate: Implications beyond Conductivity”. Chemistry of Materials (2020)

Jung Ho Yoon, Jiaming Zhang, Peng Lin, Navnidhi Upadhyay, Peng Yan, Yuzi Liu, Qiangfei Xia, J Joshua Yang. “A Low-Current and Analog Memristor with Ru as Mobile Species”. Advanced Materials (2020)

Eric Stach, James Horwath, Nikhilendra Singh, Timothy Arthur, Daan Hein Alsem, Norman Salmon. “Understanding the Relationship Between Air Exposure, Electron Dose and Beam Damage in Solid Electrolyte Materails”. Microscopy and Microanalysis (2020)

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Key Features and Capabilities

Mobile probe for electrical contacts

Probe with uncoupled coarse and fine movements along X, Y, and Z axes.

Control Software

Intuitive interface enables precise probe contact with motion control, compensation, and testing.

Characterize Electrical Contacts

Record the structure and chemistry of biased electrical contacts.

Add-ons

Enhance your in-situ experiments with advanced add-on functionalities

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How it Works

Correlate the structure and chemistry of a sample (HRTEM, electron diffraction, EELS, etc.) with its electrical properties.

Manipulate the mobile biasing probe with high spatial resolution to make electrical contacts.

Control—uncoupled—coarse and fine movements along the X, Y, and Z axes. Coarse movements are actuated with thumb-screws. Fine movements  are actuated with a piezoelectric controlled with the included controller and graphical user interface.

Take low noise electrical data with individual coax cables.

Use standard 3 mm half grid samples or FIB lift-out grids to prepare your samples

Video Spotlight

In-situ TEM of microstructural evolution in composite solid-state Li-ion batteries during charge/discharge cycles

Researchers at the University of Central Florida (UCF) have studied the structural integrity of a novel composite electrode composed of a polymer-derived ceramic nanoparticle and edge-functionalized graphene oxide during electrochemical lithiation and delithiation cycles.

They assembled a prototype nanobattery cell with a lithium metal and a SiCNO composite electrode and performed in-situ TEM lithation and delithation for at least two cycles using Hummingbird Scientific’s Biasing Manipulator TEM holder. The observed results demonstrated extraordinary structural stability of the SiCNO nanoparticles with only a 9.36% linear expansion during the lithiation (See Movie on the Left).

Reference: Zhang et al.;  ACS Appl. Mater. Interfaces 2021, 13, 8, 9794–9803.

Movie Copyright: © 2021 American Chemical Society

Awards

Award for Excellence in Technology Transfer

The Federal Laboratory Consortium (FLC) awarded the U.S. Army Engineer Research and Development Center Construction Engineering Research Laboratory for its collaboration with Hummingbird Scientific to develop new in-situ liquid TEM holder technologies including the Liquid Flow Holder.

Frequently Asked Questions

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