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TEM Tomography

Operando heating, biasing under environmental conditions

Ultra-stable low runout sample holder shaft

Our holder shafts are machined from a proprietary low expansion alloy. In every tip, the substrate itself is the only contributor to the shadowed wedge. Combined with the superior tolerance conformance that we can achieve with our in-house machine shop, the tomography sample holder design is optimized for tomographic reconstructions and high-resolution imaging where precise tilts and low runout are essential to automated workflows.

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Flexible sample and substrate compatibility

We manufacture swappable tomography tips to accommodate all forms of nanoscale sample preparation. 3mm and 1mm grids, FIB half-grids, APT stubs, and all of our 60+ varieties of chips can be transferred into the TEM for pre or post-mortem charactetization. Custom tip geometries can be designed and machined to support novel experiments.

Technical Specs
1000
Removable tips for various sample substrates
3mm full and half grids, 1mm grids, single point, Omniprobe™, Hummingbird chips
Tilt range
±90° (depending on stage limits)
Image resolution
Down to microscope spec
GD&T runout
<0.001”
Shaft concentricity
0.04
Instrument Type
TEM

Available For:

Key Features and Capabilities

Atom Probe Tomography Workflow

Directly insert half-grid or single point tomography tips into CAMECA™ APT systems

Swappable tip varieties

Get the most out of your sample holder with swappable modular tips that work with any substrate.

Advanced Configuration Options