Nihon Hummingbird Scientific offers a world-leading product line of in-situ TEM, (FIB-)SEM and X-ray sample holders for materials research.

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Visit Booth# 39 at the 82nd Annual Meeting of The Japanese Society of Microscopy from Monday, May 25 to Wednesday, May 27, 2026, at the Sendai International Center Exhibition Hall (Aoba-ku, Sendai City, Miyagi Prefecture).

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Featured products:
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• Generation V In-Situ Bulk Liquid Electrochemistry TEM/SEM/X-RAY Sample Holder
  
  • With concurrent biasing and heating
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• MEMS Heating + Biasing
  
  • Heating chips for best mechanical transfer of 2D material samples
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• Gas Environment Heating
  
  • With improved accuracy EDS mapping with less background at the highest temperatures
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• Tomography
  
  • Comprehensive and cross-correlative view for 3D sample reconstruction at the atomic and nano scale
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• Electrical Biasing
  
  • Low Noise TEM biasing holder configuration
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• Exhibit Dates and Hours:
  Monday, May 25th 10:00 am – 5:00 pm
  Tuesday, May 26th 10:00 am – 5:00 pm
  Wednesday, May 27th 9:00 am – 3:00 pm
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• You can always reach us through sales@hummingbirdscientific.com
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• 👉 Request a quote here:  https://hummingbirdscientific.com/contact/
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• To see what exciting projects Hummingbird Scientific has recently been involved in, check out and follow our LinkedIn feed

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